Commit 9b753aa1 authored by Evan Hunt's avatar Evan Hunt

shorten ht_test and random_test

parent a4ebe83c
......@@ -298,12 +298,12 @@ static void test_ht_iterator() {
ATF_TC(isc_ht_20);
ATF_TC_HEAD(isc_ht_20, tc) {
atf_tc_set_md_var(tc, "descr", "20 bit, 2M elements test");
atf_tc_set_md_var(tc, "descr", "20 bit, 200K elements test");
}
ATF_TC_BODY(isc_ht_20, tc) {
UNUSED(tc);
test_ht_full(20, 2000000);
test_ht_full(20, 200000);
}
......
......@@ -9,6 +9,13 @@
* information regarding copyright ownership.
*/
/*
* IMPORTANT NOTE:
* These tests work by generating a large number of pseudo-random numbers
* and then statistically analyzing them to determine whether they seem
* random. The test is expected to fail on occasion by random happenstance.
*/
#include <config.h>
#include <isc/random.h>
......@@ -23,6 +30,8 @@
#include <stdint.h>
#include <math.h>
#define REPS 25000
typedef double (pvalue_func_t)(isc_mem_t *mctx,
isc_uint16_t *values, size_t length);
......@@ -272,18 +281,18 @@ random_test(pvalue_func_t *func, isc_boolean_t word_sized) {
for (j = 0; j < m; j++) {
isc_uint32_t i;
isc_uint16_t values[128000];
isc_uint16_t values[REPS];
double p_value;
if (word_sized) {
for (i = 0; i < 128000; i++)
for (i = 0; i < REPS; i++)
isc_rng_randombytes(rng, &values[i],
sizeof(values[i]));
} else {
isc_rng_randombytes(rng, values, sizeof(values));
}
p_value = (*func)(mctx, values, 128000);
p_value = (*func)(mctx, values, REPS);
if (p_value >= 0.01)
passed++;
......@@ -402,7 +411,7 @@ runs(isc_mem_t *mctx, isc_uint16_t *values, size_t length) {
numbits = length * 16;
bcount = 0;
for (i = 0; i < 128000; i++)
for (i = 0; i < REPS; i++)
bcount += bitcounts_table[values[i]];
/* Debug message, not displayed when running via atf-run */
......
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